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Gundlach-Graham, Alex; Harycki, Stasia; Szakas, Sarah E.; Taylor, Tristen L.; Karkee, Hark; Buckman, Raven L.; Mukta, Shahnaz; Hu, Rui; Lee, Woolin (, Journal of Analytical Atomic Spectrometry)TOF-SPI is software for accurate, robust, and high-throughput analysis of single-particle ICP-TOFMS data.more » « less
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Kong, Seongyoung; Singh, Prashant; Akopov, Georgiy; Jing, Dapeng; Davis, Ryan; Perez-Aguilar, Jorge; Hong, Jiyun; Lee, Shannon J.; Viswanathan, Gayatri; Soto, Ernesto; et al (, Chemistry of Materials)
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